
Monitored Digital Input Modules
, Type F (T7411F, T7418F)
PD
-
7027
Mar
-
06
23
Input Circuit Test Interval
Function of application
program scan time and size
of I/O configuration.
Typically less than 2 seconds
(see page
5
for details).
External barrier, if required.
(requires threshold
adjustment, see page
15
).
0°
to 60
°
C
(3
2°
to 140
°
F)
-
40
°
to 85
°
C
(-
40
°
to 185
°
F)
0 to 95% relative humidity,
non
-
condensing
15 g, ½ sine wave, 11 msec
Electromagnetic
Interference
•
IEC 801 Part 2
-
Electrostatic
Discharges
•
IEC 801 Part 3
-
Radiated
Electromagnetic Fields
•
IEC 801 Part 4
-
Transients
and Bursts
•
ANSI/IEEE C37.90
-
Surge
Withstand Capability
Level 3: Contact discharge of
6 kV
Level 3: 10 V/M, 27 MHz
-
500 MHz
Level 4: 2 kV, 2.5 kHz for t
=
60 seconds
2.5 kV damped 1 MHz sine
wave
4 kV bi
-
directional impulse,
10 nsec rise time, fast
transient
Pending certification to DIN
V VDE 0801 for Risk Class 5.
Also designed to me
et UL
508 and CSA 22.2, No. 142
-
M1981
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